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本校於2013年2月26日獲得美國第US 8,385,629 B2號專利，專利名稱為「相位資訊擷取方法及其三維形貌量測系統」
內容：
- 專利國別：美國
- 公告日：2013年2月26日
- 專利類型：發明
- 專利號：US 8,385,629 B2
- 專利名稱：相位資訊擷取方法及其三維形貌量測系統
- 摘要：The present invention provides a band-pass filter, being capable of fitting a frequency a spectrum area having phase information in a frequency spectrum image, to obtain a spectrum information corresponding to the phase information during the process of obtaining the phase information from the frequency spectrum image with respect to an object’s surface profile. In another embodiment, the present invention further provides a method to optimize the spectrum range of the band-pass filter so as to enhance measuring accuracy and efficiency while restoring the surface of the object. In addition further provides a measurement system for measuring three-dimensional surface shapes in which a deformed fringe acquired and the phase information is obtained from the fringe pattern according to the foregoing method so as to restore the surface profile of the measured object.
- 發明人：陳亮嘉、何宣瑋、Nguyen-Xuan-Loc
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