本校於2013年4月2日獲得美國第US 8,411,284 B2號專利，專利名稱為「同步色相相移轉換方法以及其三維形貌量測系統」

內容：

1. 專利國別：美國
2. 公告日：2013年4月2日
3. 專利類型：發明
4. 專利號：US 8,411,284 B2
5. 專利名稱：同步色相相移轉換方法以及其三維形貌量測系統
6. 摘要：The present invention provides a method for simultaneous hue phase-shifting and a system for 3-D surface profilometry, wherein a single structured-light fringe pattern with encoded multiple trapezoidal color fringes is projected on an object so as to obtain a color image having deformed fringe patterns and then a hue information extracted from a HSI color model associated with the fringe pattern is transformed into a hue phase-shifting information for restructuring the 3-D surface profile of the object. Since the color structured light is composed of a plurality of colorful light having phase shifts with each other in spatial domain, the single structured-light pattern comprises multiple hue phase-shifting information so that the phase shifting and unwrapping can be performed by one-shot 3-D surface reconstruction process without needs of traditional conventional phase wrapping and Euler's transformation procedures such that the efficiency of phase shifting and 3-D surface measurement can be improved.